Nanonis Multiprobe Control System

The field of multi-probe experiments has grown substantially over the past years. Several companies offer systems equipped with two, four or even more probes to investigate a sample. In many cases an additional scanning electron microscope helps to adjust the relative position of the tips. However, the results that can be achieved today with these systems are often limited by the means to control the instrument.
 
To solve these issues and provide the research community with an easy way around these limitation SPECS has continued the development of the Nanonis SPM control system to handle multi-probe systems.

With the Nanonis Multiprobe Control System the nano-workbench becomes possible: multiple probes in multiple modes.