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Nanonis Multiprobe Control System

Multiple probes in multiple modes

The field of multi-probe experiments has grown substantially over the past years. Several companies offer systems equipped with two, four or even more probes to investigate a sample. In many cases an additional scanning electron microscope helps to adjust the relative position of the tips. However, the results that can be achieved today with these systems are often limited by the means to control the instrument.
To solve these issues and provide the research community with an easy way around these limitation SPECS has continued the development of the Nanonis SPM control system to handle multi-probe systems.

With the Nanonis Multiprobe Control System the nano-workbench becomes possible: multiple probes in multiple modes.


  Key features

  • Independent Z-Controllers and auto-approach
  • Individual mode for each tip (STM, cAFM, ncAFM, ...)
  • Simultaneous scan engines, independent scan parameters
  • Common LabVIEW programming interface
  • hrDAC (22bit resolution) on all outputs
  • Status window for all Z-Controllers and preamplifiers

  Configuration example: Multiprobe SPM
  • 16-axes piezo motor controller with single handset for coarse motion
  • Seamless adaptation to most existing multiprobe SPMs possible
  • Possible interface with Keithley SMU (through LabVIEW)
  • 4-probe transport measurements with 4 SMU
  • Extendable to AFM with OC4 module


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