Application Notes

General

22-bit resolution on all Output Channels: Nanonis hrDAC™ by M. Heyde, FHI Berlin, Germany, and Tobias Vancura, Nanonis Demonstration of the power of hrDAC - simply a software upgrade to immediately increase the resolution of all output channels.

Dual-OC4 Applications

Non-Contact Atomic Resolution in Liquid Using the Nanonis OC4 by T. Fukuma, Kanazawa University, Japan True atomic resolution with FM-mode in liquid using a home-built microscope. The cantilever is controlled by the OC4 which generates a feedback signal for the Asylum Controller.

OC4-Station and Veeco EnviroScope – Advanced Vacuum Measurements  NEW!! by K. Bouzehouane, S. Fusil, CNRS/Thales, France Combined nc-AFM and MFM measurements with Nanonis OC4-Station and Veeco EnviroScope.

Exploring Nanoelectromechanic of Ferroelectrics: PFM with Dual-OC4 Follow-up on the recent PFM workshop at the EPF-Lausanne, Switzerland. Piezoresponse Force Microscopy (PFM) in air with a Veeco MultiMode Microscope and Nanonis controller with Dual-OC4.

Compensating for CPD in nc-AFM: AM-KPFM in UHV with Dual-OC4 by Th. Glatzel and E. Meyer, University of Basel, Switzerland Amplitude Modulation Kelvin Probe measurement (AM-KPFM) in UHV conditions with a home-built AFM using two Nanonis OC4 controllers.

Single-Scan Kelvin Probe Technique in Air with a Dual Oscillation Controller by D. Ziegler and Prof. A. Stemmer, ETH Zurich, Switzerland Using two Nanonis Oscillation Controllers the group developed a new method to measure Kelvin Probe data with a Veeco MultiMode.

Single Pass Kelvin Probe Measurement Technique in Air with Dual-OC4 by H.Diesinger, D.Deresmes, and Th. Melin, IEMN, Lille, France Amplitude Modulation Kelvin Probe measurement (AM-KPFM) at ambient conditions with a Veeco MultiMode microscope using two OC4s.

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AFM Applications

Modulation of Contact Resonances: Use of PLL in Contact Mode AFM  NEW!!! by P. Steiner, R. Roth, E. Gnecco, Th. Glatzel, A. Baratoff, and E. Meyer, University of Basel, Switzerland Improved sensitivity by combining static lateral force measurements (FFM) with dynamic measurements of contact resonance frequencies.

Automated Switching Between Non-contact and Contact Modes of AFM  NEW!!! by P. Egberts, T. Filleter, R. Bennewitz, INM, Saarbruecken, Germany Automated procedure via the Programming Interface for fast, precise and safe switching between non-contact and contact AFM modes.

Friction Force Microscopy  NEW!!! by N.N. Gosvami, P. Egberts, T. Filleter, R. Bennewitz, INM, Saarbruecken, Germany Friction measurements down to single asperity contacts. Automated acquisition of friction vs. normal load making use of the Programing Interface.

Automated Amplitude Calibration In non-contact AFM by S. Kawai, Ch. Held, Th. Glatzel, University of Basel, Switzerland Routine implemented in the LabVIEW programming interface for fast and accurate calibration of the amplitude in nc-AFM.

Controlling QPlus Small Amplitudes With Nanonis Setup  by B. Such, T. Glatzel, E. Meyer, University of Basel, Switzerland Atomic resolution using Qplus sensors in nc-AFM with Nanonis electronics . One particular setup: Omicron LT-STM/Qplus microscope and Nanonis controller.

Atom Tracking used for Reproducible Force Spectroscopy   by S. Kawai, Th. Glatzel, and E. Meyer, University of Basel, Switzerland The Atom Tracking Module is used to compensate for thermal drift in X, Y, and Z while force spectroscopy curves are acquired with a room temperature AFM.

Piezoelectric quartz tuning forks for scanning probe microscopy by J. Rychen, Nanonis Theory and application of tuning forks in SPM.

Needle Sensor Operation in non-contact AFM Mode by L.Bolotov, AIST, Tsukuba, Japan Non-contact AFM at a resonance frequency of 1MHz with frequency shifts below 500mHz. Omicron LT-STM.

Optimizing PLL Feedback Paramters: Nanonis perfectPLL™ by A. Gildmeister and K. Ensslin, Swiss Federal Institute of Technology (ETH), Zurich, Switzerland Automatically setting up the PI parameters for a PLL - one click with perfectPLL. Home-built tuning fork AFM in a mixing chamber.

Femtogram resolution for in-situ monitoring of focused ion beam induced milling by V. Friedli et al., Swiss Federal Laboratories for Materials Testing and Research, Thun, Switzerland. Using a cantilever as a micro-balance with a frequency resolutions better than 1mHz with a home-built AFM in an SEM.

Integrating External Equipment - User Channels in the Nanonis SPM Control System by Dr. Y. Naitou, National Institute of Advanced Industrials Science (AIST), Tsukuba, Japan Integrating two external lock-in detectors to measure dC/dV and dC/dZ in tuning-fork based JEOL AFM.

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STM Applications

Trapped 2D Electron Gas of Cu(111) Within Regular Array of QDs: STS Study  NEW!!! by J. Lobo-Checa, M. Matena, M. Stoehr, Th. Jung, University of Basel, Switzerland Scanning Tunneling Spectroscopy study to probe two dimensional quantum confinement: supramolecular perylene derivatives porous network adsorbed on the Cu(111).

Feenstra type of Spectroscopy: Labview Programming Interface  NEW!!! by N. Ishida, K. Sueoka, Hokkaido University, Japan Precise and controlled spectroscopy for the investigation of the electronic states at surfaces

Doing Electrochemistry with an SPM tip: EC-SPM by A. Stieg and J. Gimzewski, UCLA, USA Easy adaptability and flexibility of the Nanonis controller for a home-built STM in liquid.

Spin Valves Investigated with BEMM – a Case for Nanonis's Programming Interface by E. Heindl and C. Back, Universität Regensburg, Germany. Complex automation tools written in LabVIEW using the Nanonis Programming Interface with an Omicron UHV-STM.

Supramolecular Rotary Device by N. Wintjes, A. Kiebele, M. Stöhr, H.Spiellman from University of Basel,  T. Jung from PSI Villigen, and D. Bonifazi, F. Cheng and F. Diedrich from ETH Zurich, Switzerland Investigating supramolecular assemblies for technological applications with an Omicron LT-STM.

Ultra-low current STM at 100fA in collaboration with Dr. B. Grandidier, IEMN, University of Lille, France Measuring at the ultimate limit of STM with an Omicron STM-1..