ContactSitemapLogin 
nanonis
HomeSPM-ControllerQuantum TransportPLLApplicationsReferencesCompany  
   
 

Application Notes


General


22-bit resolution on all Output Channels: Nanonis hrDAC™
by M. Heyde, FHI Berlin, Germany, and Tobias Vancura, Nanonis

Demonstration of the power of hrDAC - simply a software upgrade to immediately increase the resolution of all output channels.

Dual-OC4 Applications


Non-Contact Atomic Resolution in Liquid Using the Nanonis OC4
by T. Fukuma, Kanazawa University, Japan

True atomic resolution with FM-mode in liquid using a home-built microscope. The cantilever is controlled by the OC4 which generates a feedback signal for the Asylum Controller.


OC4-Station and Veeco EnviroScope – Advanced Vacuum Measurements 
by K. Bouzehouane, S. Fusil, CNRS/Thales, France

Combined nc-AFM and MFM measurements with Nanonis OC4-Station and Veeco EnviroScope.


Exploring Nanoelectromechanic of Ferroelectrics: PFM with Dual-OC4
Follow-up on the recent PFM workshop at the EPF-Lausanne, Switzerland.

Piezoresponse Force Microscopy (PFM) in air with a Veeco MultiMode Microscope and Nanonis controller with Dual-OC4.


Compensating for CPD in nc-AFM: AM-KPFM in UHV with Dual-OC4
by Th. Glatzel and E. Meyer, University of Basel, Switzerland

Amplitude Modulation Kelvin Probe measurement (AM-KPFM) in UHV conditions with a home-built AFM using two Nanonis OC4 controllers.


Single-Scan Kelvin Probe Technique in Air with a Dual Oscillation Controller
by D. Ziegler and Prof. A. Stemmer, ETH Zurich, Switzerland

Using two Nanonis Oscillation Controllers the group developed a new method to measure Kelvin Probe data with a Veeco MultiMode.


Single Pass Kelvin Probe Measurement Technique in Air with Dual-OC4
by H.Diesinger, D.Deresmes, and Th. Melin, IEMN, Lille, France

Amplitude Modulation Kelvin Probe measurement (AM-KPFM) at ambient conditions with a Veeco MultiMode microscope using two OC4s.



AFM Applications


Probing Quantum Transport by Scanning Gate Microscopy (SGM)
by B. Hackens, F. Martins, S. Faniel et al., IMCN, Université Catholique de Louvain, Belgium

SGM of quantum Hall effect regime at high magnetic field and cryogenic temperatures in two-dimensional electron systems: electrons are transmitted along the edges of the device through ideal one dimensional channels.


Drift-corrected 3D dynamic force spectroscopy at room temparature
by S. Kawai, Th .Glatzel, S. Koch, B. Such, A. Baratoff, E. Meyer, University of Basel, Switzerland

Room temperature free of artifacts 3D dynamic force spectroscopy on NaCl(001). Careful drift corrections by means of atom tracking used in automated way via the LabVIEW programming interface.


Improved Atomic Scale Contrast via Bimodal DFM: DUAL OC4 
by S. Kawai, Th .Glatzel, S. Koch, B. Such, A. Baratoff, E. Meyer, University of Basel, Switzerland


Simultaneous excitation of the first two normal modes of an AFM cantilever leads to remarkable improved atomic scale contrast.


Modulation of Contact Resonances: Use of PLL in Contact Mode AFM 
by P. Steiner, R. Roth, E. Gnecco, Th. Glatzel, A. Baratoff, and E. Meyer, University of Basel, Switzerland

Improved sensitivity by combining static lateral force measurements (FFM) with dynamic measurements of contact resonance frequencies.


Automated Switching Between Non-contact and Contact Modes of AFM 
by P. Egberts, T. Filleter, R. Bennewitz, INM, Saarbruecken, Germany

Automated procedure via the Programming Interface for fast, precise and safe switching between non-contact and contact AFM modes.


Friction Force Microscopy 
by N.N. Gosvami, P. Egberts, T. Filleter, R. Bennewitz, INM, Saarbruecken, Germany

Friction measurements down to single asperity contacts. Automated acquisition of friction vs. normal load making use of the Programing Interface.


Automated Amplitude Calibration In non-contact AFM
by S. Kawai, Ch. Held, Th. Glatzel, University of Basel, Switzerland

Routine implemented in the LabVIEW programming interface for fast and accurate calibration of the amplitude in nc-AFM.


Controlling QPlus Small Amplitudes With Nanonis Setup 
by B. Such, T. Glatzel, E. Meyer, University of Basel, Switzerland

Atomic resolution using Qplus sensors in nc-AFM with Nanonis electronics . One particular setup: Omicron LT-STM/Qplus microscope and Nanonis controller.


Atom Tracking used for Reproducible Force Spectroscopy  
by S. Kawai, Th. Glatzel, and E. Meyer, University of Basel, Switzerland

The Atom Tracking Module is used to compensate for thermal drift in X, Y, and Z while force spectroscopy curves are acquired with a room temperature AFM.


Piezoelectric quartz tuning forks for scanning probe microscopy
by J. Rychen, Nanonis

Theory and application of tuning forks in SPM.


Needle Sensor Operation in non-contact AFM Mode
by L.Bolotov, AIST, Tsukuba, Japan

Non-contact AFM at a resonance frequency of 1MHz with frequency shifts below 500mHz. Omicron LT-STM.


Optimizing PLL Feedback Paramters: Nanonis perfectPLL™
by A. Gildmeister and K. Ensslin, Swiss Federal Institute of Technology (ETH), Zurich, Switzerland

Automatically setting up the PI parameters for a PLL - one click with perfectPLL. Home-built tuning fork AFM in a mixing chamber.


Femtogram resolution for in-situ monitoring of focused ion beam induced milling
by V. Friedli et al., Swiss Federal Laboratories for Materials Testing and Research, Thun, Switzerland.

Using a cantilever as a micro-balance with a frequency resolutions better than 1mHz with a home-built AFM in an SEM.


Integrating External Equipment - User Channels in the Nanonis SPM Control System
by Dr. Y. Naitou, National Institute of Advanced Industrials Science (AIST), Tsukuba, Japan

Integrating two external lock-in detectors to measure dC/dV and dC/dZ in tuning-fork based JEOL AFM.



STM Applications


Far-Field Fibered Interference Scanning Optical Microscopy (iSOM) - imaging living cells
by J.P. Decombe, W. Schwartz. C. Villard, H. Guillou, J. Chevrier, S. Huant and J. Fick, Institute Néel, Grenoble, France

Complementary method for imaging of biological cells by a fibered high-resolution optical microscope: interferometric Scanning Optical Microscope (iSOM).


Trapped 2D Electron Gas of Cu(111) Within Regular Array of QDs: STS Study 
by J. Lobo-Checa, M. Matena, M. Stoehr, Th. Jung, University of Basel, Switzerland

Scanning Tunneling Spectroscopy study to probe two dimensional quantum confinement: supramolecular perylene derivatives porous network adsorbed on the Cu(111).


Feenstra type of Spectroscopy: Labview Programming Interface 
by N. Ishida, K. Sueoka, Hokkaido University, Japan

Precise and controlled spectroscopy for the investigation of the electronic states at surfaces


Doing Electrochemistry with an SPM tip: EC-SPM
by A. Stieg and J. Gimzewski, UCLA, USA

Easy adaptability and flexibility of the Nanonis controller for a home-built STM in liquid.


Spin Valves Investigated with BEMM – a Case for Nanonis's Programming Interface
by E. Heindl and C. Back, Universität Regensburg, Germany.

Complex automation tools written in LabVIEW using the Nanonis Programming Interface with an Omicron UHV-STM.


Supramolecular Rotary Device
by N. Wintjes, A. Kiebele, M. Stöhr, H.Spiellman from University of Basel,  T. Jung from PSI Villigen, and D. Bonifazi, F. Cheng and F. Diedrich from ETH Zurich, Switzerland

Investigating supramolecular assemblies for technological applications with an Omicron LT-STM.


Ultra-low current STM at 100fA
in collaboration with Dr. B. Grandidier, IEMN, University of Lille, France

Measuring at the ultimate limit of STM with an Omicron STM-1..


Atom Manipulation with NANONIS SPM CONTROLLER by S. Kawai, and E. Meyer, University of Basel, Switzerland

Atom manipulation often attracts the interest of researchers, not only for observing artificial patterns on the surface [1], but also since it allows preparing ideal “samples” on surfaces, designed for a specific measurement [2]...

 


Back  |   Print Page

nanonis   News & Events
New application note library online

Announcing our two new application notes galleries to highlight results from our SPM control system as well as the new Nanonis Tramea QTMS.

More »

Press release

attocube systems AG and SPECS Surface Nano Analysis GmbH announce a collaboration in the field of quantum transport measurements at low temperatures (read more)

All News »

nanonis   Address
        SPECS Zurich GmbH
        Technoparkstrasse 1
        8005 Zurich
        Switzerland

        Tel.:    +41-44 445 18 25
        Fax:    +41-44 445 18 26
        Mail: info@specs-zurich.com
                support@specs-zurich.com

© 2017 by Nanonis Powered by MySign